Argonne National Laboratory Facilities:

Argonne’s Molecular Environmental Science group has over 2,700 square feet of laboratory space divided into four laboratories. Available equipment includes three Coy anoxic chambers, currently set up with a nitrogen-hydrogen atmosphere; a Perkin Elmer Optima 4300 ICP-OES with autosampler for bulk elemental analysis; a Radiometer Analytical TIM900 Autotitration Manager and PHM290 pH Stat Controller; a Hewlett-Packard 5890 Series II gas chromatograph with flame ionization and thermal conductivity detectors; a Rigaku Miniflex X-ray diffractometer; a Cary 100 UV-Visible spectrophotometer; an Agilent 1100 Series high performance liquid chromatograph with autosampler, column oven, photodiode array detector, refractive index detector, and Hewlett-Packard Chemstation software; a Chemcheck kinetic phosphorescence analyzer model KPA-11; an Accumet AR50 dual-channel pH/ion/conductivity meter and a large selection of electrodes; a Barnsted Nanopure ultrapure water system; a Mettler Toledo AX205 deltarange microanalytical balance; a Labconco Freezone 4.5 freeze-dry system; a video-enabled Olympus BX60 microscope capable of viewing in phase contrast, bright field, and fluorescence modes; and several incubators, including a full sized refrigerated incubator (temperature range -10 ºC to 60 ºC) and several smaller benchtop incubators (temperature range 30 ºC to 60 ºC). Miscellaneous laboratory equipment includes gyrotory and reciprocal shakers, roller drums, temperature-controlled rockers, a sonicator, floor centrifuges, benchtop centrifuges and microcentrifuges, autoclaves, vortex mixers, ovens, desiccators, thermistors, stir plates, balances, refrigerators, and a large inventory of glassware and apparatus for chemical and microbiological experiments. 

Electron Microscopy Center. The scientists in the Electron Microscopy Collaborative Research Center at Argonne National Laboratory conduct materials research using advanced microstructure characterization methods and are at the forefront of technique and instrument development. The center has conventional, state-of-the-art, and unique electron microscopes.  The center has TEMs allowing image resolution ≥0.165 nm, energy-dispersive X-ray spectrometry (EDXS) with quantitative mapping, parallel electron energy loss spectroscopy (PEELS), energy-filtered imaging, TV-rate video imaging of dynamic events, high-angle dark-field imaging, electron dosimetry, magnetic field imaging, sample heating (1250 K), sample cooling (93 K) and in situ ion irradiation.  The center has the only high-resolution (1.5 nm at 15 kV and 2.5 nm at 1.0 kV) cold-field emission scanning electron microscope (FEG-SEM) at Argonne.  The FEG-SEM is equipped for secondary electron imaging, backscattered electron imaging, and EDXS with quantitative mapping.

Advanced Photon Source and the MRCAT X-ray Beam lines. The mission of Argonne’s Advanced Photon Source (APS) is to produce synchrotron radiation for use in forefront research in science and technology.  At its many insertion device beam lines, the APS generates the most brilliant high-energy X-ray beams available for research in the United States. The Materials Research Collaborative Access Team (MRCAT) at the APS will have two operational beam lines when fully constructed: one insertion device beam line using an undulator and one bending magnet beam line.

The undulator beam line is operational.  Presently, MRCAT's undulator can be tapered or scanned for XAFS experiments. The experimental hutch is equipped with a mirror for focusing and harmonic rejection, a fully operational 13 element solid state detector, an eight-circle goniometer, and a full compliment of ionization detectors typically found at XAFS experimental beam lines. Data can be acquired in “quick scan” mode, enabling full EXAFS data (approximately 1000 eV) acquisition in approximately 90 seconds and XANES data (approximately 300 eV) acquisition in approximately 30 seconds. Finally, MRCAT has Kirkpatrick-Baez focusing optics for production of ~5 µm by 5 µm X-ray beams.

The bending magnet is currently under construction. A monochromator and a white beam slit assembly have been ordered and delivery is expected before the end of 2006.  The experimental hutch will be completed prior to delivery of the optical components and will be equipped with a full compliment of instrumentation necessary for XAFS.  Much attention will be paid to sample handling, with an eye specifically on the requirements of environmentally relevant measurements.  Current plans include robotic sample handling and an in-line anoxic chamber.  First delivered beam is scheduled for the first quarter of 2007.

    Synchrotron Radiation Instrumentation Collaborative Access Team (SRI-CAT) X–Ray Beam line, Advanced Photon Source. The XOR beam lines, formerly the Synchrotron Radiation Instrumentation Collaborative Access Team (SRI-CAT) beam lines, encompass the first four sectors of the Advanced Photon Source (APS) at the Argonne National Laboratory.  The purpose of this CAT is to develop innovative new optics and techniques of general use to the synchrotron radiation community at large.  The CAT consists primarily of APS employed scientific staff who develop these optics/techniques in collaboration with outside scientific members. One of the SRI-CAT undulator beam lines is dedicated to the development and application of zone plate technology to the production of submicron x-ray microbeams.  The x-ray microprobe is a versatile non-invasive tool that can be applied to very broad classes of samples and configurations, tremendously expanding the potential applicability of x-ray imaging.  This technology's suboptical resolution (~90 nanometers) makes feasible the submicron-scale imaging and characterization of specimens as diverse as integrated semiconductor devices, fine airborne particles, and bacteria.  Commissioning of a new x-ray nanoprobe beam line with a demonstrated resolution of 30 nm began in February 2006.   Specimen preparation requirements for the x-ray microprobe and nanoprobe are minimal compared to the requirements for charged particle microscopy.  This significantly simplifies the interpretation of the measured images.